Variability and endurance dilemma in the TiO x /Al 2 O 3 RRAM. (a

XPS depth profile of Al 2 O 3 /HfO 2 /Al 2 O 3 on TiN-coated Si by

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The endurance and retention characteristics of the device units. a

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Electronics, Free Full-Text

Variability and endurance dilemma in the TiO x /Al 2 O 3 RRAM. (a

Ratio-based multi-level resistive memory cells

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The schematic of 3D vertical RRAM array (VRRAM_2). The memory cell